| PSM final clean (SPM free) |
| Category |
No. |
Item |
Specification |
| Blank |
1 |
Particle Free |
>32nm |
| 2 |
PRE% |
≧95% |
Image Layer
(pattern side) |
3 |
Remaining Soft defect on QZ |
≧0.05um (Yield : 98%) |
| 4 |
Remaining Soft defect on Shifter |
≧0.05um, ≦10ea (Yield : 98%) |
| 5 |
SRAF (Dark) missing |
No missing |
| 6 |
Pattern damage, ESD, Scratch |
No damage |
| 7 |
Shifter change (Phase) |
≦-0.2 degree, average by 10X clean |
| 8 |
Shifter change (Trans.) |
≦0.025%, average by 10X clean |
| 9 |
Shifter change (CD mean) |
≦0.15nm, average by 10X clean |
| 10 |
Shifter change (CD Range) |
≦0.5nm, average by 10X clean |
| Ion residues |
11 |
Chemical residue (SO4) |
≦0.5 ppb |
| 12 |
Chemical residue (NH4) |
≦17.0 ppb |